Spray pyrolysis was used to create nanocrystalline cadmium sulphide thin films on glass substrates in this study. Researcher looked examined how substrate temperature 400 oC affected the thin films’ structural, morphological, optical, electrical, Photodetection Analysis, and NO2 gas sensor characteristics. Analyses of the thin films’ optical absorption, X-ray diffraction, and field emission scanning electron microscopy (FE-SEM) have been conducted. The thin films, according to the X-ray results, were polycrystalline and had a hexagonal phase crystallite. The thin films’ surface is homogenous, consistent, and crack-free.The grains typically have an average size of 37.86 nm. The optical band gap values that have been found fall within the 2.4 eV range.  Based on Hall effect testing, the thin films were found to have n-type conductivity. The generated CdS sheets were also used to create a photodetector, which worked admirably. A high photoresponsivity and external quantum efficiency were achieved using a 400 oC substrate temperature. At 40 ppm, the CdS film had a maximum reaction of 60% and was determined to be extremely sensitive to NO2.

In this work, the conventional chemical bath deposition (CBD) technique and its growth parameters were systematically studied to deposit CdS thin films on the glass substrate. The samples were prepared using a simple aqueous solution containing cadmium sulfate ( CdSO4·, 8H2O), thiourea [SC(NH2)2], ammonium sulfate [(NH4)2SO4] as a source of cadmium, sulfur, and a complexing agent, respectively. The deposited films were characterized to study the surface morphology, crystallographic structure, chemical composition, optical and electrical properties. Through this study, the structure was determined to cubic with (111) preferential orientation and the crystallinity of the films was improved with the increase of film thickness. The transmission spectra were recorded in the range of wavelength 300–, 600 nm. The optical bandgap of the optimized CdS films was varied from 2. 43 to 2. 74 eV. All the films exhibit n-type of conductivity which was found in the order of 10–,4 to 10–,5 (1/Ω,-cm), suggesting that it would be suitable for the buffer layer in thin-film solar cells.

This article, thin films of cadmium sulfide nanocrystals (CdS)”were prepared by “Spin Coating” technology deposited on the glass substrates with various concentrations of Cd and S (0.5, 0.75, 1, 1.25) M. The structural characteristics of the prepared film were characterized using the X-ray diffraction “XRD”, The Scanning electron microscope with field emission (FE-SEM)”, the atomic force microscope (AFM), and the optical properties with UV-Visible measurement”. The thin film with a concentration of (1M) has good structural and optical properties that reveal desirable for photovoltaic applications. The “XRD” revealed that all films have a cubic phase structure, with diffraction peaks of (111), (220), and (311), respectively, at 2 = 26, 43, and 51 for the deposit) the preferred orientation of its peak (111) at 2 =26.In addition, high intensities of peaks in film concentration of 0.75 M have been observed due to high crystallinity, low crystalline size, and roughness. However, The 1 M film concentration exhibits a lower crystallinity, a small crystalline size, and a high roughness. According to the FE-SEM, The nanospheres uniformly shape the structure that has been formed throughout the whole substrate surface, and There are no fractures or pinholes in any of the Cadmium-Sulfide films, and they are uniform and neatly wrapped around the substrate. A thin layer (1 M) with a uniform absorption spectrum for all visible wavelengths has a high absorption spectrum, according to the optical characteristics. The absorption values of the thin sheet (1M) are substantial. In the viewable range, all films are transparent, according to this study. The energygap increases with the decreases in molarity, and the measured energy gap is in good agreement with the energy-gap bulk.

A study of the effect annealing on some structural, optical and electrical properties of pure CdS films on glass bases with thickness 150nm using thermal evaporation technique under pressure (4*10-5)Torr. Structural properties were studied using X-ray diffraction technology the CdS films were shown to have a polycrystalline structure of the cube type and the preferred path [111], also increases grain size with increasing annealing temperature. In the study of Hall Effect, we observed the mobility increases with increasing annealing temperature. From the study, the relationship between bias voltage and current we observed the current increases with increased annealing temperature and the intensity of light falling on photo resistor .the current of the photo resistor is doubling with the double intensity of light falling.

Thermal evaporation was used to create pure CdS thin films, which were then analyzed using XRD and UV-VIS spectroscopy. With changes in thickness, it was discovered that the particle size decreased from 23.6 nm to 21.7 nm. From the XRD data, the impact of thickness on strain and dislocation has been estimated. To determine how optical characteristics changed as thickness changed, transmission data were examined in the 200–1100 nm spectral range. Additionally, it was found that as thickness increased, between 2.444 and 2.401 eV, the band gap decreased.

In this research, the coupling of surface plasmon-polariton and surface exciton-polariton in a multilayer structure of metallic medium and columnar dielectric thin film with excitonic spacer in Kretschmann configuration theoretically is investigated; using transfer matrix method. The effect of structural parameters such as the length of columns of columnar thin film and the rise angle of them, the refractive index of prism, the void fractions of columnar thin film and the thickness of excitonic medium on coupling are studied. The results showed that the coupling becomes strength by decreasing the length of columns of dialectic medium and refractive index of prism. Also, by reducing the volume fraction of air in columnar thin film, the coupling becomes stronger as the thickness of the excitonic medium increases and the ultra- strong coupling was obtained at fv=0.2. The energy spectrum of plexciton branches in terms of detuning frequency indicates the anti-crossover behavior of plexciton modes, which includes the coupling strength of the modes from the medium to ultra-strong region.